If you would like to learn more about the IAEA’s work, sign up for our weekly updates containing our most important news, multimedia and more. The IAEA is calling on interested research institutes to ...

A four-year IAEA project involving nine research institutes resulted in the preparation of a set of guidelines aimed at standardizing small specimen test techniques (SSTT) for reference structural ...

The most effective way to prepare for exams is to start early. Give yourself plenty of time to study, sleep, eat and take breaks. Keep in mind that everyone studies, learns and retains information in ...

Design-for-test, or DFT, should facilitate high-quality test, not change the design. Test techniques and strategies need to supply a high-quality test that screens out defective devices, avoiding ...

Not all devices get tested the same way anymore, and that’s a good thing. Quality, test costs, and yield have motivated product engineers to adopt test processes that fall under the umbrella of ...

Despite its standardization as IEEE 1149.1 in 1990 and wide use in the industry, many test engineers and developers still do not fully understand the benefits of boundary scan test. The misconceptions ...

Back when semiconductor devices contained only a few thousand gates, manufacturing test was almost an afterthought. The development team threw the chip “over the wall” to the test engineers, who ...