In the field of physical optics, a propagating light beam is known as a propagating electromagnetic radiation, with the direction of propagation being horizontal to the direction of the electric and ...

Spectroscopic ellipsometry is widely adopted in semiconductor processing, such as in the manufacturing of integrated circuits, flat display panels, and solar cells. However, a conventional ...

A German–Israeli research team led by Dr. Andreas Furchner has demonstrated how imaging ellipsometry enables non-destructive characterization and quality control of microstructured MXene thin films ...

The Ellipsometry is a total optical measurement method. This technique is used to measure the change of polarization of light when passing through a medium. Due to the layer structure during ...

Terahertz polarimetry and spectroscopy encompass a suite of methods for analysing the polarisation state and spectral content of electromagnetic radiation in the terahertz band (0.1–10 THz). By ...

Come learn how to collect measurements on the instrument. Involves hands-on practice of sample alignment and data collection. Due to limited space in the cleanroom, there are only 10 spots available ...

Left: Thickness image of MXene-based capacitive comb-structure devices (light contrast) on a silicon wafer with 100 nm oxide (red). Right: Two magnifications highlighting film homogeneity at the ...