NEC Corporation announced today the development of super-resolution technologies for fine magnification of surveillance camera images, including persons' faces and license plates. Until now, existing ...

In a recent paper published in Nature on March 6, 2012 under the daunting title of “Ptychographic electron microscopy using high-angle dark-field scattering for sub-nanometre resolution imaging,” ...

Optical microscopy is a very useful technique to examine the appearance of a sample with greater detail, but there are some limitations that provide a boundary to its use in practice. Cross section of ...